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Demonstration of frequency doubler application using ZnO-DN..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
Lee, Yongsu ; Hwang, Hyeon Jun ; Lee, Byoung Hun - p. 1-4 , 2023
Link: https://doi.org/10.1109/ICMTS55420.2023.10094079