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1 Ergebnisse
1
Static and LFN/RTN Local and Global Variability Analysis Us..:
, In:
2023 35th International Conference on Microelectronic Test Structure (ICMTS)
,
Gauthier, Owen
;
Haendler, Sebastien
;
Beucher, Ronan
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/ICMTS55420.2023.10094087
RT T1 <cTitle>2023 35th International Conference on Microelectronic Test Structure (ICMTS)</cTitle>: T1 <Title>Static and LFN/RTN Local and Global Variability Analysis Using an Addressable Array Test Structure</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10094087&Exemplar=1&LAN=DE A1 Gauthier, Owen A1 Haendler, Sebastien A1 Beucher, Ronan A1 Scheer, Patrick A1 Rafhay, Quentin A1 Theodorou, Christoforos YR 2023 SN 2158-1029 K1 Performance evaluation K1 Time-frequency analysis K1 Statistical analysis K1 Switches K1 Logic gates K1 Microelectronics K1 Low-frequency noise K1 matching K1 low frequency noise K1 Random Telegraph Noise K1 variability K1 addressable test structure K1 statistical analysis SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ICMTS55420.2023.10094087 DO https://doi.org/10.1109/ICMTS55420.2023.10094087 SF ELIB - SuUB Bremen
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