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Identifying nano-Schottky diode currents in silicon diodes ..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
Knezevic, Tihomir ; Nanver, Lis K - p. 1-6 , 2023
Link: https://doi.org/10.1109/ICMTS55420.2023.10094164