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1 Ergebnisse
1
Real-time electrical measurements during laser attack on ST..:
, In:
2023 35th International Conference on Microelectronic Test Structure (ICMTS)
,
Yazigy, Nicole
;
Postel-Pellerin, Jeremy
;
Marca, Vincenzo Della
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/ICMTS55420.2023.10094166
RT T1 <cTitle>2023 35th International Conference on Microelectronic Test Structure (ICMTS)</cTitle>: T1 <Title>Real-time electrical measurements during laser attack on STT-MRAM</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10094166&Exemplar=1&LAN=DE A1 Yazigy, Nicole A1 Postel-Pellerin, Jeremy A1 Marca, Vincenzo Della A1 Sousa, Ricardo. C. A1 Ribotta, Anne-Lise A1 Pendina, Gregory Di A1 Canet, Pierre YR 2023 SN 2158-1029 K1 Radiation effects K1 Semiconductor lasers K1 Optical switches K1 Power lasers K1 Measurement by laser beam K1 Optical variables measurement K1 Real-time systems K1 STT-MRAM K1 laser attack K1 electrical characterization K1 non-volatile memories K1 security K1 reliability SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ICMTS55420.2023.10094166 DO https://doi.org/10.1109/ICMTS55420.2023.10094166 SF ELIB - SuUB Bremen
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