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Design and Analysis of Discrete FET Monitors in 7nm FinFET ..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
Vidya, V. ; Zamdmer, N. ; Mechler, T.... - p. 1-3 , 2023
Link: https://doi.org/10.1109/ICMTS55420.2023.10094206