I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Characterization and simulation of delamination on package-..:
, In:
2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
,
Kniely, R.
;
Heilmann, J.
;
Huber, F.
. - p. 1-11 , 2023
Link:
https://doi.org/10.1109/EuroSimE56861.2023.10100778
RT T1 <cTitle>2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)</cTitle>: T1 <Title>Characterization and simulation of delamination on package-level considering sub-critical interfacial fracture-parameters under cyclic loading</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10100778&Exemplar=1&LAN=DE A1 Kniely, R. A1 Heilmann, J. A1 Huber, F. A1 Wunderle, B. YR 2023 SN 2833-8596 K1 Loading K1 Bending K1 Fatigue K1 Silicon K1 Behavioral sciences K1 Microelectronics K1 Reliability SP 1 OP 11 LK http://dx.doi.org/https://doi.org/10.1109/EuroSimE56861.2023.10100778 DO https://doi.org/10.1109/EuroSimE56861.2023.10100778 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
