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1 Ergebnisse
1
Predictable ESD Criteria with Proposed Comparison Diagram b..:
, In:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Lee, Hyeokjae
;
Kim, Dong-Sung
;
Noh, Jae-Young
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/EDTM55494.2023.10102935
RT T1 <cTitle>2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Predictable ESD Criteria with Proposed Comparison Diagram between TLP and HBM ESD for Various Device Technologies and Different Substrates</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10102935&Exemplar=1&LAN=DE A1 Lee, Hyeokjae A1 Kim, Dong-Sung A1 Noh, Jae-Young A1 Kim, Youngboo A1 Park, Jisun A1 Shin, Hyungsoon YR 2023 K1 Analytical models K1 Correlation K1 Layout K1 Electrostatic discharges K1 Manufacturing K1 Substrates K1 HBM ESD K1 TLP K1 Lookup diagram K1 TCAD SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM55494.2023.10102935 DO https://doi.org/10.1109/EDTM55494.2023.10102935 SF ELIB - SuUB Bremen
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