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A Comprehensive Cryogenic CMOS Variability and Reliability ..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Grill, A. ; Michl, J. ; Diaz-Fortuny, J.... - p. 1-3 , 2023
Link: https://doi.org/10.1109/EDTM55494.2023.10102937