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1 Ergebnisse
1
Improvement of RTS Noise and Peel Off Issue of BSI CIS Prod..:
, In:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Kim, So-Yun
;
Kim, Joohee
;
Hong, Heejeong
.. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/EDTM55494.2023.10102943
RT T1 <cTitle>2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Improvement of RTS Noise and Peel Off Issue of BSI CIS Products by Changing FEP Film Stack Raw Material</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10102943&Exemplar=1&LAN=DE A1 Kim, So-Yun A1 Kim, Joohee A1 Hong, Heejeong A1 Lee, Youngju A1 Lee, Wonho YR 2023 K1 Mass production K1 Sensitivity K1 CMOS image sensors K1 Raw materials K1 Silicon K1 Manufacturing K1 Transistors K1 CMOS image sensor K1 RTS noise and FEP SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/EDTM55494.2023.10102943 DO https://doi.org/10.1109/EDTM55494.2023.10102943 SF ELIB - SuUB Bremen
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