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A Study of the non-Weibull distribution of HK PMOS TDDB:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Hwang, Jeong-hwan ; Lee, Yong Gon ; Lee, Sang Ho. - p. 1-4 , 2023
Link: https://doi.org/10.1109/EDTM55494.2023.10102956