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1 Ergebnisse
1
Pixel Design with Improved Demodulation Contrast for Indire..:
, In:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Jang, Jaehyung
;
Choi, Hoon-Moo
;
Kim, Jongchae
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/EDTM55494.2023.10102981
RT T1 <cTitle>2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Pixel Design with Improved Demodulation Contrast for Indirect Time-of-Flight CMOS Image Sensor</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10102981&Exemplar=1&LAN=DE A1 Jang, Jaehyung A1 Choi, Hoon-Moo A1 Kim, Jongchae A1 Kim, Kyungdo A1 Oh, Hoon-Sang A1 Song, Chang-Rock YR 2023 K1 Sensitivity K1 Costs K1 Collaboration K1 Companies K1 Sensor phenomena and characterization K1 CMOS image sensors K1 Manufacturing K1 ToF K1 CIS K1 Pixel K1 Depth Imager SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM55494.2023.10102981 DO https://doi.org/10.1109/EDTM55494.2023.10102981 SF ELIB - SuUB Bremen
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