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A new back-to-back graded AlGaN barrier for complementary i..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Zhou, Jinggui ; Do, Huy-Binh ; De Souza, Maria Merlyne - p. 1-3 , 2023
Link: https://doi.org/10.1109/EDTM55494.2023.10103055