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1 Ergebnisse
1
Performance Evaluation of Strain Effectiveness of Sub-5 nm ..:
, In:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Lee, Ji Hwan
;
Kim, Kihwan
;
Rim, Kyungjin
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/EDTM55494.2023.10103058
RT T1 <cTitle>2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Performance Evaluation of Strain Effectiveness of Sub-5 nm GAA FETs with Compact Modeling based on Neural Networks</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10103058&Exemplar=1&LAN=DE A1 Lee, Ji Hwan A1 Kim, Kihwan A1 Rim, Kyungjin A1 Chong, Soogine A1 Cho, Hyunbo A1 Oh, Saeroonter YR 2023 K1 Ring oscillators K1 Simulation K1 Gallium arsenide K1 Field effect transistors K1 SPICE K1 Silicon K1 Semiconductor process modeling K1 Strain K1 GAA FETs K1 Compact model SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM55494.2023.10103058 DO https://doi.org/10.1109/EDTM55494.2023.10103058 SF ELIB - SuUB Bremen
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