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1 Ergebnisse
1
Automatic prediction of MOSFETs threshold voltage by machin..:
, In:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Choi, Seoyeon
;
Park, Dong Geun
;
Kim, Min Jung
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/EDTM55494.2023.10103059
RT T1 <cTitle>2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Automatic prediction of MOSFETs threshold voltage by machine learning algorithms</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10103059&Exemplar=1&LAN=DE A1 Choi, Seoyeon A1 Park, Dong Geun A1 Kim, Min Jung A1 Bang, Seain A1 Kim, Jungchun A1 Jin, Seunghee A1 Huh, Ki Seok A1 Kim, Donghyun A1 Kim, Sanghyeok A1 Yoon, Inkyu A1 Mitard, Jerome A1 Han, Cheol E. A1 Lee, Jae Woo YR 2023 K1 Performance evaluation K1 Semiconductor device modeling K1 Training K1 Machine learning algorithms K1 Materials reliability K1 Predictive models K1 Prediction algorithms K1 MOSFET K1 Threshold Voltage Extraction K1 Machine Learning SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM55494.2023.10103059 DO https://doi.org/10.1109/EDTM55494.2023.10103059 SF ELIB - SuUB Bremen
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