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Drain Current Variability in 2-levels Stacked Nanowire Gate..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Kim, Donghyun ; Barraud, Sylvain ; Ghibaudo, Gerard.. - p. 1-3 , 2023
Link: https://doi.org/10.1109/EDTM55494.2023.10103067