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1 Ergebnisse
1
Performance Evaluation of AFeRAM under Low Temperature Oper..:
, In:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Chen, Yi-Chuan
;
Chen, Yu-Chen
;
Hsiang, Kuo-Yu
.. - p. 1-3 , 2023
Link:
https://doi.org/10.1109/EDTM55494.2023.10103076
RT T1 <cTitle>2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Performance Evaluation of AFeRAM under Low Temperature Operation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10103076&Exemplar=1&LAN=DE A1 Chen, Yi-Chuan A1 Chen, Yu-Chen A1 Hsiang, Kuo-Yu A1 Lee, Min-Hung A1 Su, Pin YR 2023 K1 Temperature measurement K1 Temperature sensors K1 Temperature distribution K1 Capacitors K1 Switches K1 Writing K1 Data models SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM55494.2023.10103076 DO https://doi.org/10.1109/EDTM55494.2023.10103076 SF ELIB - SuUB Bremen
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