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1
An approach to represent time series by patterns and proces..:
, In:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Kim, Sunjung
;
Park, Chulhyun
;
Chae, Soohyun
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/EDTM55494.2023.10103083
RT T1 <cTitle>2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>An approach to represent time series by patterns and process dependent statistics to present properties of signals</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10103083&Exemplar=1&LAN=DE A1 Kim, Sunjung A1 Park, Chulhyun A1 Chae, Soohyun A1 Sohn, Minkyu A1 Lee, Changho A1 Kim, Younghoon A1 Park, Jae-Yong YR 2023 K1 Wavelet transforms K1 Deep learning K1 Heuristic algorithms K1 Time series analysis K1 Manufacturing K1 Classification algorithms K1 Decision trees K1 pattern K1 time series K1 classification K1 statistic SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM55494.2023.10103083 DO https://doi.org/10.1109/EDTM55494.2023.10103083 SF ELIB - SuUB Bremen
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