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1 Ergebnisse
1
Novel SCR Device for ESD Protection with High-Holding Volta..:
, In:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Chul Lim, Myoung
;
Bum Eom, Young
;
Cheul Choi, Joung
.. - p. 1-3 , 2023
Link:
https://doi.org/10.1109/EDTM55494.2023.10103097
RT T1
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
: T1
Novel SCR Device for ESD Protection with High-Holding Voltage in 0.18um BCD Process
UL https://suche.suub.uni-bremen.de/peid=ieee-10103097&Exemplar=1&LAN=DE A1 Chul Lim, Myoung A1 Bum Eom, Young A1 Cheul Choi, Joung A1 Wook Nam, Sang A1 Soo Park, Jeong YR 2023 K1 Performance evaluation K1 Integrated circuits K1 Voltage measurement K1 Power system management K1 Electrostatic discharges K1 Robustness K1 Manufacturing SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM55494.2023.10103097 DO https://doi.org/10.1109/EDTM55494.2023.10103097 SF ELIB - SuUB Bremen
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