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1 Ergebnisse
1
Deep Learning for Semiconductor Materials and Devices Desig:
, In:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Jeong, Changwook
;
Myung, Sanghoon
;
Choi, Byungseon
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/EDTM55494.2023.10103098
RT T1 <cTitle>2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Deep Learning for Semiconductor Materials and Devices Design</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10103098&Exemplar=1&LAN=DE A1 Jeong, Changwook A1 Myung, Sanghoon A1 Choi, Byungseon A1 Kim, Jinwoo A1 Jang, Wonik A1 Huh, In A1 Myung Choe, Jae A1 Kim, Young-Gu A1 Sin Kim, Dae YR 2023 K1 Semiconductor device modeling K1 Deep learning K1 Performance evaluation K1 Fabrication K1 Semiconductor materials K1 Predictive models K1 Etching K1 semiconductor device SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM55494.2023.10103098 DO https://doi.org/10.1109/EDTM55494.2023.10103098 SF ELIB - SuUB Bremen
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