I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Cross-Temperature Reliabilities in TLC 3D NAND Flash Memory..:
, In:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Guo, Yifan
;
Xie, Kenie
;
Fang, Xiaotong
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/EDTM55494.2023.10103107
RT T1 <cTitle>2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Cross-Temperature Reliabilities in TLC 3D NAND Flash Memory: Characterization and Solution</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10103107&Exemplar=1&LAN=DE A1 Guo, Yifan A1 Xie, Kenie A1 Fang, Xiaotong A1 Zhan, Xuepeng A1 Wu, Jixuan A1 Chen, Jiezhi YR 2023 K1 Temperature measurement K1 Temperature distribution K1 Semiconductor device measurement K1 Three-dimensional displays K1 Voltage measurement K1 Measurement uncertainty K1 Programming SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM55494.2023.10103107 DO https://doi.org/10.1109/EDTM55494.2023.10103107 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
