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1 Ergebnisse
1
A Comprehensive Simulation Study on Capacitive Memory With ..:
, In:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Zhang, Hongrui
;
Jin, Chengji
;
Jia, Xiaole
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/EDTM55494.2023.10103108
RT T1 <cTitle>2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>A Comprehensive Simulation Study on Capacitive Memory With Metal-Ferroelectric-Insulator-Semiconductor Structure</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10103108&Exemplar=1&LAN=DE A1 Zhang, Hongrui A1 Jin, Chengji A1 Jia, Xiaole A1 Chen, Jiajia A1 Liu, Huan A1 Liu, Yan A1 Yu, Xiao A1 Han, Genquan YR 2023 K1 Switches K1 Doping K1 Writing K1 Capacitance K1 Semiconductor process modeling K1 Manufacturing K1 Magnetic field induced strain K1 ferroelectric K1 capacitive memory SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM55494.2023.10103108 DO https://doi.org/10.1109/EDTM55494.2023.10103108 SF ELIB - SuUB Bremen
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