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On The Contribution of Secondary Holes in Hot-Carrier Degra..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Tyaginov, S.E. ; Bury, E. ; Grill, A.... - p. 1-3 , 2023
Link: https://doi.org/10.1109/EDTM55494.2023.10103111