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1 Ergebnisse
1
An Improved Robust Infinitely Differentiable Drift Resistan..:
, In:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Singhal, Anant
;
Gill, Garima
;
Pahwa, Girish
.. - p. 1-3 , 2023
Link:
https://doi.org/10.1109/EDTM55494.2023.10103122
RT T1
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
: T1
An Improved Robust Infinitely Differentiable Drift Resistance Model for BSIM High Voltage Compact Model
UL https://suche.suub.uni-bremen.de/peid=ieee-10103122&Exemplar=1&LAN=DE A1 Singhal, Anant A1 Gill, Garima A1 Pahwa, Girish A1 Hu, Chenming A1 Agarwal, Harshit YR 2023 K1 Resistance K1 Industries K1 Runtime K1 Voltage K1 Production K1 High-voltage techniques K1 Numerical models K1 BSIM-BULK K1 Gummel Symmetry test K1 Harmonic Balance test K1 LDMOS SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM55494.2023.10103122 DO https://doi.org/10.1109/EDTM55494.2023.10103122 SF ELIB - SuUB Bremen
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