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1 Ergebnisse
1
Variable-Temperature Broadband Noise Characterization of MO..:
, In:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Ohmori, Kenji
;
Amakawa, Shuhei
- p. 1-3 , 2023
Link:
https://doi.org/10.1109/EDTM55494.2023.10103124
RT T1 <cTitle>2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Variable-Temperature Broadband Noise Characterization of MOSFETs for Cryogenic Electronics: From Room Temperature down to 3 K</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10103124&Exemplar=1&LAN=DE A1 Ohmori, Kenji A1 Amakawa, Shuhei YR 2023 K1 Cryogenic electronics K1 MOSFET K1 Spectroscopy K1 Temperature K1 Program processors K1 White noise K1 Broadband communication K1 cryogenic electronics K1 noise SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM55494.2023.10103124 DO https://doi.org/10.1109/EDTM55494.2023.10103124 SF ELIB - SuUB Bremen
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