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A 7nm Gate-All-Around Nanowire n-FET for DNA Sequencing:

, In: 2022 4th International Conference on Sustainable Technologies for Industry 4.0 (STI),
Islam, Mohammad A. ; Islam, Azmin ; Datta, Palash K.. - p. 1-6 , 2022
Link: https://doi.org/10.1109/STI56238.2022.10103262