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1 Ergebnisse
1
Near Strike Lightning Electromagnetic Field Environment Dam..:
, In:
2022 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)
,
Chao, Chen
;
Huang, Zheng-Yu
;
Dan, Ren
... - p. 1-3 , 2022
Link:
https://doi.org/10.1109/IMWS-AMP54652.2022.10106957
RT T1 <cTitle>2022 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)</cTitle>: T1 <Title>Near Strike Lightning Electromagnetic Field Environment Damage Test to Civilian Computer</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10106957&Exemplar=1&LAN=DE A1 Chao, Chen A1 Huang, Zheng-Yu A1 Dan, Ren A1 Fu, Shang-Chen A1 Duan, Yan-Tao A1 Chao, Li A1 Liang, Yan-Qiu A1 Gong, Xiu-Zhen YR 2022 SN 2694-2992 K1 Couplings K1 Electronic equipment K1 Lightning K1 Voltage K1 Safety K1 Communication cables K1 Magnetic fields K1 Near strike lightning K1 Electromagnetic fields K1 Damage test SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/IMWS-AMP54652.2022.10106957 DO https://doi.org/10.1109/IMWS-AMP54652.2022.10106957 SF ELIB - SuUB Bremen
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