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1 Ergebnisse
1
Research on the Principle of Fast Amplitude Measurement Bas..:
, In:
2022 5th International Conference on Electronics and Electrical Engineering Technology (EEET)
,
Liu, Mi
;
Shi, Junbiao
;
Ma, Tao
... - p. 158-162 , 2022
Link:
https://doi.org/10.1109/EEET58130.2022.00034
RT T1 <cTitle>2022 5th International Conference on Electronics and Electrical Engineering Technology (EEET)</cTitle>: T1 <Title>Research on the Principle of Fast Amplitude Measurement Based on AC Surge Voltage Test</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10110872&Exemplar=1&LAN=DE A1 Liu, Mi A1 Shi, Junbiao A1 Ma, Tao A1 He, Xiong A1 Wang, Li A1 Ji, Mingming YR 2022 K1 Semiconductor device measurement K1 Time-frequency analysis K1 Voltage measurement K1 Power measurement K1 Power supplies K1 Voltage transformers K1 Capacitance K1 AC surge K1 amplitude measurement K1 variable speed integration K1 quick response SP 158 OP 162 LK http://dx.doi.org/https://doi.org/10.1109/EEET58130.2022.00034 DO https://doi.org/10.1109/EEET58130.2022.00034 SF ELIB - SuUB Bremen
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