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Analog and mixed signal BIST: too much, too little, too lat..:

, In: Proceedings 20th IEEE VLSI Test Symposium (VTS 2002),
DeWilkins, W. ; Baril, B. ; Osseiran, A.... - p. 175 , 2002
Link: https://doi.org/10.1109/VTS.2002.1011134