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1 Ergebnisse
1
Design of Picoammeter for Test and Measurement:
, In:
2023 15th International Conference on Computer and Automation Engineering (ICCAE)
,
Latina, Mary Ann E.
;
Valiente, Leonardo D.
;
Carmen, Glendel A.
.. - p. 513-518 , 2023
Link:
https://doi.org/10.1109/ICCAE56788.2023.10111445
RT T1 <cTitle>2023 15th International Conference on Computer and Automation Engineering (ICCAE)</cTitle>: T1 <Title>Design of Picoammeter for Test and Measurement</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10111445&Exemplar=1&LAN=DE A1 Latina, Mary Ann E. A1 Valiente, Leonardo D. A1 Carmen, Glendel A. A1 Lim, Maria Isabel Y. A1 Chua, Kimberly O. YR 2023 SN 2154-4360 K1 Semiconductor device modeling K1 Operational amplifiers K1 Semiconductor device measurement K1 Instruments K1 Current measurement K1 Dielectric measurement K1 Time measurement K1 picoammeter K1 instrumentation amplifier K1 low level measurements K1 noise K1 settling time Introduction SP 513 OP 518 LK http://dx.doi.org/https://doi.org/10.1109/ICCAE56788.2023.10111445 DO https://doi.org/10.1109/ICCAE56788.2023.10111445 SF ELIB - SuUB Bremen
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