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Measuring stray capacitance on tester hardware:

, In: Proceedings 20th IEEE VLSI Test Symposium (VTS 2002),
Halder, A. ; Variyam, P. ; Chatterjee, A.. - p. 351,352,353,354,355,356 , 2002
Link: https://doi.org/10.1109/VTS.2002.1011164