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1 Ergebnisse
1
Depassivation of Traps in the Polysilicon Channel of 3D NAN..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Giulianini, Mattia
;
Malavena, Gerardo
;
Chiavarone, Luca
.. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10117584
RT T1
2023 IEEE International Reliability Physics Symposium (IRPS)
: T1
Depassivation of Traps in the Polysilicon Channel of 3D NAND Flash Arrays: Impact on Cell High-Temperature Data Retention
UL https://suche.suub.uni-bremen.de/peid=ieee-10117584&Exemplar=1&LAN=DE A1 Giulianini, Mattia A1 Malavena, Gerardo A1 Chiavarone, Luca A1 Spinelli, Alessandro S. A1 Compagnoni, Christian Monzio YR 2023 SN 1938-1891 K1 Temperature sensors K1 Temperature measurement K1 Temperature dependence K1 Three-dimensional displays K1 Reliability engineering K1 Threshold voltage K1 Arrays K1 NAND Flash memory K1 3D array K1 polysilicon K1 semiconductor device reliability SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10117584 DO https://doi.org/10.1109/IRPS48203.2023.10117584 SF ELIB - SuUB Bremen
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