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1 Ergebnisse
1
Evidence of Carbon Doping Effect on VTH Drift and Dynamic-R..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Cioni, M.
;
Giorgino, G.
;
Chini, A.
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10117585
RT T1
2023 IEEE International Reliability Physics Symposium (IRPS)
: T1
Evidence of Carbon Doping Effect on VTH Drift and Dynamic-RON of 100V p-GaN Gate AlGaN/GaN HEMTs
UL https://suche.suub.uni-bremen.de/peid=ieee-10117585&Exemplar=1&LAN=DE A1 Cioni, M. A1 Giorgino, G. A1 Chini, A. A1 Miccoli, C. A1 Castagna, M. E. A1 Moschetti, M. A1 Tringali, C. A1 Iucolano, F. YR 2023 SN 1938-1891 K1 Performance evaluation K1 Doping K1 HEMTs K1 Logic gates K1 Wide band gap semiconductors K1 MODFETs K1 Carbon K1 GaN HEMTs K1 Carbon doping K1 Trap dynamics K1 VTH drift K1 Dynamic-RON SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10117585 DO https://doi.org/10.1109/IRPS48203.2023.10117585 SF ELIB - SuUB Bremen
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