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1
Enhancing reliability of a strong physical unclonable funct..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Cattaneo, L.
;
Baldo, M.
;
Lepri, N.
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10117586
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Enhancing reliability of a strong physical unclonable function (PUF) solution based on virgin-state phase change memory (PCM)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10117586&Exemplar=1&LAN=DE A1 Cattaneo, L. A1 Baldo, M. A1 Lepri, N. A1 Sancandi, F. A1 Borghi, M. A1 Petroni, E. A1 Serafini, A. A1 Annunziata, R. A1 Redaelli, A. A1 Ielmini, D. YR 2023 SN 1938-1891 K1 Phase change materials K1 Phased arrays K1 Switches K1 Physical unclonable function K1 Entropy K1 Phase change memory K1 System-on-chip K1 physical unclonable function K1 phase change mem-ory K1 non-volatile memory K1 reliability modeling K1 hardware security SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10117586 DO https://doi.org/10.1109/IRPS48203.2023.10117586 SF ELIB - SuUB Bremen
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