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1 Ergebnisse
1
Extended Analysis of Power Cycling Behavior of TO-Packaged ..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Kovacevic-Badstuebner, Ivana
;
Race, Salvatore
;
Grossner, Ulrike
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10117650
RT T1
2023 IEEE International Reliability Physics Symposium (IRPS)
: T1
Extended Analysis of Power Cycling Behavior of TO-Packaged SiC Power MOSFETs
UL https://suche.suub.uni-bremen.de/peid=ieee-10117650&Exemplar=1&LAN=DE A1 Kovacevic-Badstuebner, Ivana A1 Race, Salvatore A1 Grossner, Ulrike A1 Mengotti, Elena A1 Kenel, Christoph A1 Bianda, Enea A1 Jormanainen, Joni YR 2023 SN 1938-1891 K1 Semiconductor device modeling K1 Heating systems K1 MOSFET K1 Silicon carbide K1 Metallization K1 Wires K1 Thermal shock K1 power cycling K1 SiC power MOSFETs K1 FEM modeling K1 solder K1 TO-package K1 bond wires SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10117650 DO https://doi.org/10.1109/IRPS48203.2023.10117650 SF ELIB - SuUB Bremen
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