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1 Ergebnisse
1
Dynamic Interplay of Surface and Buffer Traps in Determinin..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Mir, Mehak Ashraf
;
Joshi, Vipin
;
Chaudhuri, Rajarshi Roy
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10117664
RT T1
2023 IEEE International Reliability Physics Symposium (IRPS)
: T1
Dynamic Interplay of Surface and Buffer Traps in Determining Drain Current Injection induced Device Instability in OFF-state of AlGaN/GaN HEMTs
UL https://suche.suub.uni-bremen.de/peid=ieee-10117664&Exemplar=1&LAN=DE A1 Mir, Mehak Ashraf A1 Joshi, Vipin A1 Chaudhuri, Rajarshi Roy A1 Munshi, Mohammad Ateeb A1 Malik, Rasik Rashid A1 Shrivastava, Mayank YR 2023 SN 1938-1891 K1 Electric potential K1 Surface resistance K1 Voltage K1 HEMTs K1 Wide band gap semiconductors K1 Reliability K1 Stress K1 Dynamic ON Resistance (RON) K1 AlGaN/GaN HEMTs K1 Current injection K1 GaN buffer traps K1 GaN surface traps SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10117664 DO https://doi.org/10.1109/IRPS48203.2023.10117664 SF ELIB - SuUB Bremen
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