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Insight Into HCI Reliability on I/O Nitrided Devices:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Doyen, C. ; Yon, V. ; Garros, X.... - p. 1-5 , 2023
Link: https://doi.org/10.1109/IRPS48203.2023.10117681