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Polarity Dependency and 1/E Model of Gate Oxide TDDB Degrad..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Qu, Lina ; Yang, Shengwei ; He, Ming... - p. 1-4 , 2023
Link: https://doi.org/10.1109/IRPS48203.2023.10117688