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1 Ergebnisse
1
Excellent Reliability performances of a truly 5V nBOXFET fo..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Lipp, D.
;
Zhao, Z.
;
Krause, G.
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10117689
RT T1
2023 IEEE International Reliability Physics Symposium (IRPS)
: T1
Excellent Reliability performances of a truly 5V nBOXFET for Automotive and IOT applications
UL https://suche.suub.uni-bremen.de/peid=ieee-10117689&Exemplar=1&LAN=DE A1 Lipp, D. A1 Zhao, Z. A1 Krause, G. A1 Arfaoui, W. A1 Ebrard, E. A1 Bossu, G. A1 Evseev, S. A1 Herklotz, M. A1 Siddabathula, M. YR 2023 SN 1938-1891 K1 Performance evaluation K1 Human computer interaction K1 Degradation K1 Silicon-on-insulator K1 Voltage K1 Logic gates K1 Reliability K1 FDSOI K1 buried oxide K1 BOXFET K1 TDDB K1 HCI K1 BTl K1 PID K1 Automotive SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10117689 DO https://doi.org/10.1109/IRPS48203.2023.10117689 SF ELIB - SuUB Bremen
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