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1 Ergebnisse
1
A New Methodology to Precisely Induce Wake-Up for Reliabili..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Tan, Tiang Teck
;
Wang, Yu-Yun
;
Tan, Joel
... - p. 1-7 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10117723
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>A New Methodology to Precisely Induce Wake-Up for Reliability Assessment of Ferroelectric Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10117723&Exemplar=1&LAN=DE A1 Tan, Tiang Teck A1 Wang, Yu-Yun A1 Tan, Joel A1 Wu, Tian-Li A1 Raghavan, Nagarajan A1 Pey, Kin Leong YR 2023 SN 1938-1891 K1 Degradation K1 Performance evaluation K1 Electrodes K1 Ferroelectric devices K1 Current measurement K1 Voltage K1 Fatigue K1 Ferroelectric K1 Ramp Voltage Stress K1 Constant Voltage Stress K1 Wake-up K1 Reliability K1 Defect Distribution K1 Trap Assisted Tunneling SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10117723 DO https://doi.org/10.1109/IRPS48203.2023.10117723 SF ELIB - SuUB Bremen
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