I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Using dedicated device arrays for the characterization of T..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Saraza-Canflanca, P.
;
Diaz-Fortuny, J.
;
Vici, A.
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10117773
RT T1
2023 IEEE International Reliability Physics Symposium (IRPS)
: T1
Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology
UL https://suche.suub.uni-bremen.de/peid=ieee-10117773&Exemplar=1&LAN=DE A1 Saraza-Canflanca, P. A1 Diaz-Fortuny, J. A1 Vici, A. A1 Bury, E. A1 Degraeve, R. A1 Kaczer, B. YR 2023 SN 1938-1891 K1 Temperature measurement K1 Degradation K1 Voltage measurement K1 Temperature K1 Dielectric breakdown K1 Reliability K1 Voltage control K1 CMOS K1 Characterization K1 HKMG K1 Time-Dependent Dielectric Breakdown (TDDB) SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10117773 DO https://doi.org/10.1109/IRPS48203.2023.10117773 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)