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Using dedicated device arrays for the characterization of T..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Saraza-Canflanca, P. ; Diaz-Fortuny, J. ; Vici, A.... - p. 1-6 , 2023
Link: https://doi.org/10.1109/IRPS48203.2023.10117773