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1 Ergebnisse
1
Studying the Impact of Temperature Gradient on Electromigra..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Yi, Yong Hyeon
;
Kim, Chris
;
Zhou, Chen
.. - p. 1-5 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10117811
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10117811&Exemplar=1&LAN=DE A1 Yi, Yong Hyeon A1 Kim, Chris A1 Zhou, Chen A1 Kteyan, Armen A1 Sukharev, Valeriy YR 2023 SN 1938-1891 K1 Heating systems K1 Temperature distribution K1 Tensile stress K1 Wires K1 Metals K1 Market research K1 Power grids K1 Electromigration K1 power grid K1 on-chip heater K1 temperature gradient K1 reliability K1 void K1 TTF SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10117811 DO https://doi.org/10.1109/IRPS48203.2023.10117811 SF ELIB - SuUB Bremen
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