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Drain voltage impact on charge redistribution in GaN-on-Si ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Leurquin, C. ; Vandendaele, W. ; Gwoziecki, R.... - p. 1-6 , 2023
Link: https://doi.org/10.1109/IRPS48203.2023.10117813