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1 Ergebnisse
1
On the ESD behavior of a-Si:H based diode-connected thin- f..:
, In:
2022 IEEE International Conference on Emerging Electronics (ICEE)
,
Sinha, Rajat
;
Sambandan, Sanjiv
;
Shrivastava, Mayank
- p. 1-5 , 2022
Link:
https://doi.org/10.1109/ICEE56203.2022.10117825
RT T1
2022 IEEE International Conference on Emerging Electronics (ICEE)
: T1
On the ESD behavior of a-Si:H based diode-connected thin- film transistors
UL https://suche.suub.uni-bremen.de/peid=ieee-10117825&Exemplar=1&LAN=DE A1 Sinha, Rajat A1 Sambandan, Sanjiv A1 Shrivastava, Mayank YR 2022 K1 Performance evaluation K1 Charge carriers K1 Logic gates K1 Electrostatic discharges K1 Behavioral sciences K1 Thin film transistors K1 Transistors SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ICEE56203.2022.10117825 DO https://doi.org/10.1109/ICEE56203.2022.10117825 SF ELIB - SuUB Bremen
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