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On the ESD behavior of a-Si:H based diode-connected thin- f..:

, In: 2022 IEEE International Conference on Emerging Electronics (ICEE),
Sinha, Rajat ; Sambandan, Sanjiv ; Shrivastava, Mayank - p. 1-5 , 2022
Link: https://doi.org/10.1109/ICEE56203.2022.10117825