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Classification of Commercial SiC-MOSFETs Based on Time-Depe..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Murakami, E. ; Takeshita, T. ; Oda, K.... - p. 1-7 , 2023
Link: https://doi.org/10.1109/IRPS48203.2023.10117833