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1 Ergebnisse
1
Impact of Phase-Change Memory Drift on Energy Efficiency an..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Frank, Martin M.
;
Li, Ning
;
Rasch, Malte J.
... - p. 1-10 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10117874
RT T1
2023 IEEE International Reliability Physics Symposium (IRPS)
: T1
Impact of Phase-Change Memory Drift on Energy Efficiency and Accuracy of Analog Compute-in-Memory Deep Learning Inference (Invited)
UL https://suche.suub.uni-bremen.de/peid=ieee-10117874&Exemplar=1&LAN=DE A1 Frank, Martin M. A1 Li, Ning A1 Rasch, Malte J. A1 Jain, Shubham A1 Chen, Ching-Tzu A1 Muralidhar, Ramachandran A1 Han, Jin-Ping A1 Narayanan, Vijay A1 Philip, Timothy M. A1 Brew, Kevin A1 Simon, Andrew A1 Saraf, Iqbal A1 Saulnier, Nicole A1 Boybat, Irem A1 Wozniak, Stanislaw A1 Sebastian, Abu A1 Narayanan, Pritish A1 Mackin, Charles A1 Chen, An A1 Tsai, Hsinyu A1 Burr, Geoffrey W. YR 2023 SN 1938-1891 K1 Phase change materials K1 Deep learning K1 Resistance K1 Virtual machine monitors K1 Transformers K1 Energy efficiency K1 Phase change memory K1 Analog memory K1 in-memory computing K1 neural networks K1 phase change memory K1 semiconductor device reliability SP 1 OP 10 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10117874 DO https://doi.org/10.1109/IRPS48203.2023.10117874 SF ELIB - SuUB Bremen
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