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Impact of Phase-Change Memory Drift on Energy Efficiency an..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Frank, Martin M. ; Li, Ning ; Rasch, Malte J.... - p. 1-10 , 2023

Link: https://doi.org/10.1109/IRPS48203.2023.10117874

RT 
T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Impact of Phase-Change Memory Drift on Energy Efficiency and Accuracy of Analog Compute-in-Memory Deep Learning Inference (Invited)</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10117874&Exemplar=1&LAN=DE
				
A1 Frank, Martin M.
A1 Li, Ning
A1 Rasch, Malte J.
A1 Jain, Shubham
A1 Chen, Ching-Tzu
A1 Muralidhar, Ramachandran
A1 Han, Jin-Ping
A1 Narayanan, Vijay
A1 Philip, Timothy M.
A1 Brew, Kevin
A1 Simon, Andrew
A1 Saraf, Iqbal
A1 Saulnier, Nicole
A1 Boybat, Irem
A1 Wozniak, Stanislaw
A1 Sebastian, Abu
A1 Narayanan, Pritish
A1 Mackin, Charles
A1 Chen, An
A1 Tsai, Hsinyu
A1 Burr, Geoffrey W.
YR 2023
SN 1938-1891
K1 Phase change materials
K1 Deep learning
K1 Resistance
K1 Virtual machine monitors
K1 Transformers
K1 Energy efficiency
K1 Phase change memory
K1 Analog memory
K1 in-memory computing
K1 neural networks
K1 phase change memory
K1 semiconductor device reliability
SP 1
OP 10
LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10117874
DO https://doi.org/10.1109/IRPS48203.2023.10117874
SF ELIB - SuUB Bremen

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