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1 Ergebnisse
1
Microscopic Characterization of Failure Mechanisms in Long-..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Zhang, Z.J.
;
Li, Q.
;
Dong, Z.Y.
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10117971
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Microscopic Characterization of Failure Mechanisms in Long-Term Implanted Microwire Neural Electrodes</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10117971&Exemplar=1&LAN=DE A1 Zhang, Z.J. A1 Li, Q. A1 Dong, Z.Y. A1 Wang, W.T. A1 Lai, S.T. A1 Yang, X. A1 Liang, F. A1 Wang, C.L. A1 Luo, C. A1 Lyu, L.J. A1 Li, Z. A1 Xu, J.M. A1 Wu, X. YR 2023 SN 1938-1891 K1 Electrodes K1 Degradation K1 Scanning electron microscopy K1 Sensitivity K1 Microscopy K1 Failure analysis K1 Materials reliability K1 Failure Mechanism K1 Electron Microscope K1 Neural Electrode K1 Reliability SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10117971 DO https://doi.org/10.1109/IRPS48203.2023.10117971 SF ELIB - SuUB Bremen
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