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1 Ergebnisse
1
Enhanced DRAM Single Bit Characteristics from Process Contr..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Rim, Taiuk
;
Che, Kyosuk
;
Kwon, Sehyun
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118042
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Enhanced DRAM Single Bit Characteristics from Process Control of Chlorine</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10118042&Exemplar=1&LAN=DE A1 Rim, Taiuk A1 Che, Kyosuk A1 Kwon, Sehyun A1 Lee, Jin-Seong A1 Oh, Jeonghoon A1 Ban, Hyodong A1 Lee, Jooyoung YR 2023 SN 1938-1891 K1 Fabrication K1 Impurities K1 Chlorine K1 Random access memory K1 Process control K1 Capacitance K1 Product design K1 DRAM K1 Process K1 Interface trap K1 Refresh time K1 Row hammer SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118042 DO https://doi.org/10.1109/IRPS48203.2023.10118042 SF ELIB - SuUB Bremen
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