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1 Ergebnisse
1
Near Zero Field Magnetoresistance Spectroscopy: A New Tool ..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Lenahan, P. M.
;
Frantz, E. B.
;
King, S. W.
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118053
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Near Zero Field Magnetoresistance Spectroscopy: A New Tool in Semiconductor Reliability Physics</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10118053&Exemplar=1&LAN=DE A1 Lenahan, P. M. A1 Frantz, E. B. A1 King, S. W. A1 Anders, M. A. A1 Moxim, S. J. A1 Ashton, J. P. A1 Myers, K. J. A1 Flatte, M. E. A1 Harmon, N. J. YR 2023 SN 1938-1891 K1 Semiconductor device measurement K1 Magnetic field measurement K1 Current measurement K1 Silicon nitride K1 Dielectric measurement K1 Reliability K1 Magnetoresistance K1 MOSFETs K1 reliability SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118053 DO https://doi.org/10.1109/IRPS48203.2023.10118053 SF ELIB - SuUB Bremen
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