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1 Ergebnisse
1
Towards the understanding of ferroelectric-intrinsic variab..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Wu, Yishan
;
Cai, Puyang
;
Liu, Zhiwei
.. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118078
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10118078&Exemplar=1&LAN=DE A1 Wu, Yishan A1 Cai, Puyang A1 Liu, Zhiwei A1 Ren, Pengpeng A1 Ji, Zhigang YR 2023 SN 1938-1891 K1 Degradation K1 Phased arrays K1 Sensitivity K1 Reliability engineering K1 Threshold voltage K1 Delays K1 Transistors K1 FeFET K1 MCAM K1 Process variations K1 Reliability K1 Retention SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118078 DO https://doi.org/10.1109/IRPS48203.2023.10118078 SF ELIB - SuUB Bremen
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