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1 Ergebnisse
1
Static, Dynamic, and Short-circuit Characteristics of Split..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Kim, Dongyoung
;
DeBoer, Skylar
;
Mancini, Stephen A
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118091
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Static, Dynamic, and Short-circuit Characteristics of Split-Gate 1.2 kV 4H-SiC MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10118091&Exemplar=1&LAN=DE A1 Kim, Dongyoung A1 DeBoer, Skylar A1 Mancini, Stephen A A1 Isukapati, Sundar Babu A1 Lynch, Justin A1 Yun, Nick A1 Morgan, Adam J A1 Jang, Seung Yup A1 Sung, Woongje YR 2023 SN 1938-1891 K1 MOSFET K1 Microprocessors K1 Switching loss K1 Computer architecture K1 Logic gates K1 Split gate flash memory cells K1 Reliability K1 Short-Circuit ruggedness K1 Switching K1 Non-Isothermal simulation K1 Split-Gate (SG) K1 4H-SiC K1 MOSFETs SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118091 DO https://doi.org/10.1109/IRPS48203.2023.10118091 SF ELIB - SuUB Bremen
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